Quigley Scientific: Impact Durability of Point-of-Sale Electronic Device


Impact Durability of Point-of-Sale Electronic Device


Drop and day-to-day handling analysis and design review of point of sale scanning device. A critical design review and forensic analysis was completed on the device performance. Several recommendations were generated and implemented. The analysis involved relating the peak dynamic stress loading to critical regions in the device. The finite element study related to the thread root level of stress concentration of a critical component.

 

 

Back to Project Headings

 


Copyright ©1998-2017 by Quigley Scientific Corporation. All worldwide rights reserved.
Quigley Scientific Corporation